The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...
Laser scanning techniques have revolutionised the field of geodesy by enabling the rapid collection of high-resolution three‐dimensional data. These methods utilise laser pulses to generate dense ...
Scanning probe microscopes (SPMs) are instruments that measure properties of surfaces. They include atomic force microscopes (AFMs) and scanning tunnelling microscopes (STMs). In their first ...
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